产品高可靠性
| Reference | Test Condition | Duratio | Lots | S.S (pcs) | Accept Criteria |
| JESD22-A113 J-STD-02 | Preconditioning (MSL 3): Moisture Preconditioning +3 x reflow: UHAST/TC/PC/HAS | N/A | 1 | 308 | 0 Fail |
| JESD22-A104 | Temperature Cycle: -55℃/150℃ | 1000cy | 1 | 77 | 0 Fail |
| JESD22-A103 | High Temperature Storage: 150 | 1000hrs | 1 | 77 | 0 Fail |
| JESD22-A118 | Ubias Highly Accelerated Stress Test: 130℃/85%RH/33.3psia | 96hrs | 1 | 77 | 0 Fail |
| JESD22-A110 | Highly Accelerated Stress Test: 130℃/85%RH/Bias=100 | 96hrs | 1 | 77 | 0 Fail |
| JESD22-A122 | Power Cycle: -25℃/150°C/ΔTvj=100℃ | 10000cу | 1 | 77 | 0 Fail |
| JESD22-A108 | High Temp Gate Bias: 150℃/6V VGS | 1000hrs | 1 | 77 | 0 Fail |
| JESD22-A10 | High Temp Reverse Bias 150℃/520V VD | 1000hrs | 1 | 77 | 0 Fail |
| JS-001-2014 | Human Body Model ESD | N/A | 1 | 3 | 0 Fail |
| JS-001-2014 | Charged Device Model ESD | N/A | 1 | 3 | 0 Fail |
粤公网安备44030002001087号